Semiconductor

  • Desktop quality inspection machine

     Model: YDV-200

    A brand new model launched by Ulead New Technology!
    Equipped with a self-developed appearance inspection system to replace FQC manual sampling inspection.
    Use high-resolution CCD to detect missed defects after random inspection of production.
     
  • Small size and can be placed on the desktop
  • Newly developed inspection system (AOI+AI)
  • 3 million pixel high-resolution CCD
  • RGB three-color light source + 18 mixed light detection
  • Wide size compatibility (MLCC 01005-2220)
  • Patented vibration-free turntable feeding
  • AOI+AI appearance inspection (single or three sides)
  • RGB color check
  • Image contrast enhancement function
  • Auto dimming
  • Analysis of inspection results
  • Check results are posted online
  • Golden Sample verification
  • Automatically generate AI learning reports
 
Item Specifications
Detection element MLCC
Corresponding size 01005、0201、0402、0603、0805、1206、1210、1812、2220
processing speed 3500pics/min (0402maximum)
light source RGB three-color light source
Image analysis 3 million pixels
Detection range One side inspection (Up top surface), inside and outside/end surface (option)
Feeding method Glass turntable guide rail material distribution
Discharge port OK, NG, unchecked box
size, weight W600mm x L600mm x H1700mm (excluding three-color lamp)