|
| |
Solar Cell
|
EL Visual Inspection System
Principle
EL is the emission of light due to an applied voltage, when silicon solar cell is forward biased. By this higher reliability machine, it can number the defect.
Capability
For solar cell testing：
- Test current
- Test outer defect.：Damage, missing... etc
- Test inside defect：Micro-crack which can not be examined by human eye and general CCD.
|
|
|
|
|
|
